Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Applied Surface Science
سال: 2009
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2009.10.026